BIT-Enabled VCSEL-Based Parallel Optic Transceivers
Charles Kuznia
Ultra Communications, USA
Abstract
We discuss the implementation of built-in-test (BIT) functionality within multi-gigabit VCSEL-based fiber optic transceivers designed for harsh environment applications. BIT technology has promise to ensure the performance of optical pathways and reduce the maintenance costs of fiber optic networks. We will show the BIT measurements of the electrical signal entering the VCSEL driver (average voltage and signal amplitude), the optical signal entering the receiver (average power and signal amplitude), VCSEL voltage, and optical time domain reflectometry (OTDR) of the cable path with a fault isolation of 1 cm. These BIT measurements are stored within the transceiver and read-out with a 2-wire digital port. We will present the results of BIT incorporation into a low-profile transceiver with a removable fiber pigtail, capable of 12.5 Gbps data transport on each of 4 channels (50 Gbps aggregate).
Bio
Dr. Kuznia is the President of Ultra Communications. He performs research & development efforts and program management in support of photonic programs. His current projects involve the development of fiber optical communication components for harsh environment applications. This work includes the component and system level design of high-speed (> 10 Gbps) components based on flip-chip bond packaging of optoelectronic components, circuitry and lens components. He has over 25 technical publications and 9 patents (filed, pending or granted) in the areas of integrated optoelectronic/VLSI systems, free-space and fiber optic interconnects, and diffractive micro-lens array and grating design. Dr. Kuznia has previously served as Director of Photonic Products at Peregrine Semiconductor, and Professor of Electrical Engineering at the University of Southern California.

